Wei Li

Affiliations:
  • University of Iowa, Department of ECE, Iowa City, IA, USA


According to our database1, Wei Li authored at least 5 papers between 2003 and 2005.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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Links

On csauthors.net:

Bibliography

2005
Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage.
Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

On Reducing Peak Current and Power during Test.
Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

2004
On test generation for transition faults with minimized peak power dissipation.
Proceedings of the 41th Design Automation Conference, 2004

2003
An Improved Markov Source Design for Scan BIST.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

A scan BIST generation method using a markov source and partial bit-fixing.
Proceedings of the 40th Design Automation Conference, 2003


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