A scan BIST generation method using a markov source and partial bit-fixing. - Wei Li 023; Chaowen Yu; Sudhakar M. Reddy; Irith Pomeranz (DAC, 2003)

An Improved Markov Source Design for Scan BIST. - Chaowen Yu; Wei Li 023; Sudhakar M. Reddy; Irith Pomeranz (IOLTS, 2003)

On test generation for transition faults with minimized peak power dissipation. - Wei Li 023; Sudhakar M. Reddy; Irith Pomeranz (DAC, 2004)

On Reducing Peak Current and Power during Test. - Wei Li 023; Sudhakar M. Reddy; Irith Pomeranz (ISVLSI, 2005)

Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. - Wei Li 023; Seongmoon Wang; Srimat T. Chakradhar; Sudhakar M. Reddy (VLSI Design, 2005)