Active Fault Tolerant Control Based on a Novel Tracking Differentiator for Elevating Stage Control System. - Haijie Mao; Wei Li 113; Xiaolin Feng (J. Control. Sci. Eng., 2018)

Research on Co-Design between Security Control and Communication for a Class of Nonlinear CPS under Cyber Attack. - Li Zhao; Wei Li 113; Yajie Li; Yahong Shi (CAA SAFEPROCESS, 2019)

Research on secure control and communication for cyber-physical systems under cyber-attacks. - Wei Li 113; Yahong Shi; Yajie Li (Trans. Inst. Meas. Control, 2019)

Research on Satisfactory Integrated Design of Event-Triggered Fault Accommodation and Network Communication Saving for NCSs With Actuator Saturation Under Non-Uniform Transmission. - Yajie Li; Wei Li 113 (IEEE Access, 2020)

Co-Design of Dual Security Control and Communication for Nonlinear CPS Under DoS Attack. - Li Zhao; Wei Li 113 (IEEE Access, 2020)

Active Fault Tolerance Control Based on Consistent Matrix for Multimotor Synchronous System. - Haijie Mao; Wei Li 113; Xiaolin Feng; Haochuan Zhang (Complex., 2020)

Research on Dual Security Control for a Non-Linear CPS with Multi-Objective Constraints under DoS Attack and Actuator Fault: An Active-Passive Attack-Tolerant Approach. - Li Zhao; Wei Li 113; Yajie Li (J. Control. Sci. Eng., 2022)

Research on Abnormal Diagnosis Method of Benzene-ethylene Ratio Double-layer Architecture Control System based on OHEncoding-XGBoost. - Huichao Cao; Lei Du; Wei Li 113; Shengyu Wang (SAFEPROCESS, 2023)

A Fusion Method of Data-driven and Mechanism Analysis for ICPS Integrated Security Control. - Jingjing Chen; Wei Li 113; Yajie Li (SAFEPROCESS, 2023)

Research on comprehensive security control of ICPS based on DoS attacks energy-grading under ADETCS. - Yajie Li; Gang Li; Wei Li 113 (SAFEPROCESS, 2023)

Adaptive event-triggered security control for nonlinear CPS under DoS attack. - Li Zhao; Wei Li 113 (SAFEPROCESS, 2023)

Research on Industrial Sensor Self-Diagnosis Method Based on Redundancy Relationship Analysis. - Dongnian Jiang; Tianrui Chu; Wei Li 113 (IEEE Trans. Instrum. Meas., 2025)