Defect inspection research on fabric based on template correction and primitive decomposition. - Wei Liu 113; Xingzhi Chang; Jiuzhen Liang; Zhenjie Hou; Li Xu (IET Image Process., 2019)

Bilayer Markov Random Field Method for Detecting Defects in Patterned Fabric. - Xingzhi Chang; Wei Liu 113; Chuan Zhu; Xiaohua Zou; Guan Gui 001 (J. Circuits Syst. Comput., 2022)