A Fast Testing Method for Sequential Circuits at the State Trasition Level. - Wei-Lun Wang; Jhing-Fa Wang; Kuen-Jong Lee (ITC, 1992)

A General Structure of Feedback Shift Registers for Built-In Self Test. - Kuen-Jong Lee; Wei-Lun Wang; Jhing-Fa Wang (J. Inf. Sci. Eng., 1998)

Accelerated test pattern generators for mixed-mode BIST environments. - Wei-Lun Wang; Kuen-Jong Lee (Asian Test Symposium, 2000)

An on-chip march pattern generator for testing embedded memory cores. - Wei-Lun Wang; Kuen-Jong Lee; Jhing-Fa Wang (IEEE Trans. Very Large Scale Integr. Syst., 2001)

An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment. - Wei-Lun Wang; Kuen-Jong Lee (J. Electron. Test., 2002)

March Based Memory Core Test Scheduling for SOC. - Wei-Lun Wang (Asian Test Symposium, 2004)

A complete memory address generator for scan based March algorithms. - Wei-Lun Wang; Kuen-Jong Lee (MTDT, 2005)

Relay Placement Problem in Smart Grid Deployment. - Wei-Lun Wang; Quincy Wu (ISoLA (1), 2010)

2-Connected relay placement problem in wireless sensor networks. - Wei-Lun Wang; Bang-Heng Liou; Aaron Solomon (DICTAP, 2012)

Fabrication of few-mode crystalline core fiber. - Chih-Wei Chuang; Wei-Lun Wang; Fang-Yen Lo; Chun-Nien Liu; Yi-Chung Huang; Ta-Lung Chou; Wood-Hi Cheng; Sheng-Lung Huang (ICAIT, 2013)

Broadband fluorescence enhancement in Cr-doped fibers. - Chun-Nien Liu; Yi-Chung Huang; Yen-Sheng Lin; Jau-Sheng Wang; Fang-Yen Lo; Wei-Lun Wang; Ta-Lung Chou; Pi Ling Huang; Sheng-Lung Huang; Wood-Hi Cheng (OFC/NFOEC, 2013)