An Accurate Timing-Aware Diagnosis Algorithm for Multiple Small Delay Defects. - Po-Juei Chen; Wei-Li Hsu; James Chien-Mo Li; Nan-Hsin Tseng; Kuo-Yin Chen; Wei-pin Changchien; Charles C. C. Liu (Asian Test Symposium, 2011)

Diagnosis and Layout Aware (DLA) Scan Chain Stitching. - Jing Ye 001; Yu Huang 005; Yu Hu 001; Wu-Tung Cheng; Ruifeng Guo; Liyang Lai; Ting-Pu Tai; Xiaowei Li 001; Wei-pin Changchien; Daw-Ming Lee; Ji-Jan Chen; Sandeep C. Eruvathi; et al. (IEEE Trans. Very Large Scale Integr. Syst., 2015)

An On-Chip Current-Sink-Free Adaptive-Timing Power Impedance Measurement (PIM) Unit for 3D-IC in 5nm FinFET Technology. - Tsung-Che Lu; Chin-Ming Fu; Wei-Hsiang Wang; Fred Kuo; Chih-Hsien Chang; Kenny Hsieh; King-Ho Tam; Tze-Chiang Huang; Tom Chen 002; Mei Wong; Wei-pin Changchien; Frank Lee 004 (VLSI Technology and Circuits, 2024)