Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk. - Ming-Hong Tsai; Wei-Sheng Ding; Hung-Yi Hsieh; James Chien-Mo Li (IEEE Trans. Very Large Scale Integr. Syst., 2014)

Test Pattern Modification for Average IR-Drop Reduction. - Wei-Sheng Ding; Hung-Yi Hsieh; Cheng-Yu Han; James Chien-Mo Li; Xiaoqing Wen (IEEE Trans. Very Large Scale Integr. Syst., 2016)