Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications. - Shih-che Hung; Shih-Chang Chen; Pei-Shan Chien; Yu-Sheng Cho; Yung-Huei Lee; Wei-Shuo Hung (IRPS, 2021)