Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation. - Summer F. C. Tseng; Wei-Ting Kary Chien; Bing-Chu Cai (Microelectron. Reliab., 2003)

A cost-effective wafer-level reliability test system for integrated circuit makers. - Summer Fan-Chung Tseng; Wei-Ting Kary Chien; Excimer Gong; Bing-Chu Cai (IEEE Trans. Instrum. Meas., 2003)

Some practical considerations for effective and efficient wafer-level reliability control. - Summer F. C. Tseng; Wei-Ting Kary Chien; Excimer Gong; Willings Wang; Bing-Chu Cai (Microelectron. Reliab., 2004)

A New Method to Determine the Reliability Comparability for Products, Components, and Systems in Reliability Testing. - Wei-Ting Kary Chien; Siyuan Frank Yang (IEEE Trans. Reliab., 2007)

A Practical, Innovative Method for Electro-Static Discharge Data Analysis. - Wei-Ting Kary Chien; Siyuan Frank Yang (IEEE Trans. Reliab., 2010)

Editorial: Reduce Time-to-Market by Considering Reliability Tradeoffs. - Wei-Ting Kary Chien; Ming Li (IEEE Trans. Reliab., 2012)

A study on the optimization of wafer pre-treatment conditions for thin film stability monitor. - Taicheng Kevin Gong; Yanju Lisa Yu; Yan Kaily Cao; Xueliang Ruben Zhang; Kaiyuan Kevin Chang; Wei-Ting Kary Chien (IEEM, 2014)

The investigation of semiconductor shipping bag reliability. - Hailin Jonson Gao; Xueliang Ruben Zhang; Yanju Lisa Yu; Kaiyuan Kevin Chang; Wei-Ting Kary Chien (IEEM, 2015)

Wafer level package wafer probing shift error-proof quality control. - Morn Jin; Wenwen He; John Qiao; Wei-Ting Kary Chien; Shirley Zhao (IEEM, 2015)

Comprehensive Wafer Level Package Die Processing Service quality control enhancement. - John Qiao; Morn Jin; Wenwen He; Wei-Ting Kary Chien; Shirley Zhao (IEEM, 2015)

The reversed intrinsic curve and voltage dependence for ultra-low k dielectrics. - Wei-Ting Kary Chien; Atman Yong Zhao; Liwen Zhang; Flora Cheng (IRPS, 2015)

Electromigration Lifetime Optimization by Uniform Designs and a New Lifetime Index. - Siyuan Frank Yang; Wei-Ting Kary Chien (IEEE Trans. Reliab., 2015)

Influence of I/O oxide process on the NBTI performance of 28 nm HfO2-based HKMG p-MOSFETs. - Wei-Ting Kary Chien; Yueqin Zhu; Yongliang Song; Atman Yong Zhao (Microelectron. Reliab., 2016)

Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests. - Wei-Ting Kary Chien; Atman Yong Zhao; Yueqin Zhu; Yongliang Song (Microelectron. Reliab., 2016)

Exploration of baking temperature effects on 28 nm BEOL reliability. - Xiangfu Zhao; Wei-Ting Kary Chien (Microelectron. Reliab., 2017)

Investigations and detections on a new BEOL dielectric failure mechanism at advanced technologies. - Wei-Ting Kary Chien; Atman Yong Zhao; Liwen Zhang; Zhijuan Wang (Microelectron. Reliab., 2018)

Fast Semiconductor Reliability Assessments Using SPRT. - Wei-Ting Kary Chien; Andrew Chung; Way Kuo (IEEE Trans. Reliab., 2019)