Virtual Metrology Modeling based on Gaussian Bayesian Network. - Wei-Ting Yang; Jakey Blue; Agnès Roussy; Marco S. Reis; Jacques Pinaton (WSC, 2018)

A physics-informed Run-to-Run control framework for semiconductor manufacturing. - Wei-Ting Yang; Jakey Blue; Agnès Roussy; Jacques Pinaton; Marco S. Reis (Expert Syst. Appl., 2020)

A Structure Data-Driven Framework for Virtual Metrology Modeling. - Wei-Ting Yang; Jakey Blue; Agnès Roussy; Jacques Pinaton; Marco S. Reis (IEEE Trans Autom. Sci. Eng., 2020)

Bayesian network structure learning using scatter search. - Wei-Ting Yang; Karim Tamssaouet; Stéphane Dauzère-Pérès (Knowl. Based Syst., 2024)