EBL: Efficient background learning for x-ray security inspection. - Wei Wang 445; Linyang He; Yiqing Li; Kai Zhou; Linchao Li; Guohua Cheng; Ting Wen (Appl. Intell., 2023)

Learning from ambiguous labels for X-Ray security inspection via weakly supervised correction. - Wei Wang 445; Linyang He; Guohua Cheng; Ting Wen; Yan Tian (Multim. Tools Appl., 2024)