The Detection Technology of High-Power Microwave: A Review. - Lining Jia; Ying Wang 041; Yanxing Song; Wanzhao Cui; Zeyu Chen; Rui Wang; Yuqian Liu; Wei Zhang 351; Mengtian Bao (IEEE Trans. Instrum. Meas., 2024)

Simulation Study on Single-Event Burnout Reliability of 900V 4H-SiC Quasi Vertical Double Diffused MOSFET. - Jin-Ke Shi; Ying Wang 041; Xin-Xing Fei; Biao Sun; Yan-Xing Song; Yu-Qian Liu; Wei Zhang 351 (IEEE Access, 2025)