Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy. - Peng Luan; Yibang Wang; Wei Zhao 057; Chen Liu 024; Faguo Liang; Aihua Wu 007; Jing Du 004 (IEEE Trans. Instrum. Meas., 2020)

A Reformulation and Sensitivity Analysis of TRL. - Wei Zhao 057; Yibang Wang (IEEE Trans. Instrum. Meas., 2020)

Sensitivity Analysis of S-Parameter Measurements Due to Nonideal SOLR Calibration Standards. - Wei Zhao 057; Chunyue Cheng; Lin Li 045 (IEEE Trans. Instrum. Meas., 2021)

A Novel Reformulation of LNN Calibration Algorithm. - Wei Zhao 057 (IEEE Trans. Instrum. Meas., 2023)