Interference Confocal Microscope Integrated with Spatial Phase Shifter. - Weibo Wang 002; Kang Gu; Xiaoyu You; Jiubin Tan; Jian Liu 009 (Sensors, 2016)

Wide-Spectrum Microscope with a Long Working Distance Aspherical Objective Based on Obscuration Constraint. - Weibo Wang 002; Chao Wang 012; Jian Liu 009; Jiubin Tan (Sensors, 2016)

Loss reweight in scale dimension: A simple while effective feature selection strategy for anchor-free detectors. - Pengfei Liu; Yuhan Guo 002; Jiubin Tan; Weibo Wang 002 (Image Vis. Comput., 2022)

Being Aware of Localization Accuracy By Generating Predicted-IoU-Guided Quality Scores. - Pengfei Liu; Weibo Wang 002; Yuhan Guo 002; Jiubin Tan (CoRR, 2023)

Semantic Segmentation of Metal Surface Defects and Corresponding Strategies. - Zhao Zhang; Weibo Wang 002; Xiaoyan Tian (IEEE Trans. Instrum. Meas., 2023)

EFFNet: Element-wise feature fusion network for defect detection of display panels. - Feng He; Jiubin Tan; Weibo Wang 002; Shutian Liu; Yuemin Zhu; Zhengjun Liu (Signal Process. Image Commun., 2023)

CA-SegNet: A channel-attention encoder-decoder network for histopathological image segmentation. - Feng He; Weibo Wang 002; Lijuan Ren; Yixuan Zhao; Zhengjun Liu; Yuemin Zhu (Biomed. Signal Process. Control., 2024)

Being aware of localization accuracy by generating predicted-IoU-guided quality scores. - Pengfei Liu; Changguang Song; Yuhan Guo 002; Guixin Tang; Weibo Wang 002; Jiubin Tan (Neurocomputing, 2024)

Adaptive Weighted Error-Correction Method Based on the Error Distribution Characteristics of Multi-Channel Alignment. - Peiyu Song; Weibo Wang 002; Biwei Wu; Limin Zou; Tianpeng Zhan; Jiubin Tan; Xuemei Ding (Sensors, 2024)

Multi-stage few-shot micro-defect detection of patterned OLED panel using defect inpainting and multi-scale Siamese neural network. - Shujiao Ye; Zheng Wang; Pengbo Xiong; Xinhao Xu; Lintong Du; Jiubin Tan; Weibo Wang 002 (J. Intell. Manuf., 2024)

Visual inspection system for crack defects in metal pipes. - Zhao Zhang; Weibo Wang 002; Xiaoyan Tian; Cheng Luo; Jiubin Tan (Multim. Tools Appl., 2024)

A Multiscale Attention Mechanism Super-Resolution Confocal Microscopy for Wafer Defect Detection. - Xuefeng Sun; Baoyuan Zhang; Yushan Wang; Jialuo Mai; Yuhang Wang; Jiubin Tan; Weibo Wang 002 (IEEE Trans Autom. Sci. Eng., 2025)

A Lightweight, Real-Time, and High-Precision Calibrated Photometric Stereo Measurement Method. - Zhao Zhang; Han Feng; Xiaoyan Tian; Peiyan Hu; Yuetong Chang; Guangming Xia; Shuxian Shang; Biwei Wu; Weibo Wang 002 (IEEE Trans. Instrum. Meas., 2025)