A Passed Test Case Cluster Method to Improve Fault Localization. - Weibo Wang 007; Yonghao Wu; Yong Liu 030 (J. Circuits Syst. Comput., 2021)

Theoretical Analysis and Empirical Study on the Impact of Coincidental Correct Test Cases in Multiple Fault Localization. - Yonghao Wu; Yong Liu 030; Weibo Wang 007; Zheng Li 002; Xiang Chen 005; Paul Doyle (IEEE Trans. Reliab., 2022)