Single-image reflection removal via self-supervised diffusion models. - Zhengyang Lu 001; Weifan Wang 007; Tianhao Guo; Feng Wang 055 (J. Supercomput., 2025)

Differentiable NMS via Sinkhorn Matching for End-to-End Fabric Defect Detection. - Zhengyang Lu 001; Bingjie Lu; Weifan Wang 007; Feng Wang 055 (CoRR, 2025)

CLIP-aware domain-adaptive super-resolution. - Zhengyang Lu 001; Qian Xia; Weifan Wang 007; Feng Wang 055 (Multim. Syst., 2025)