Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors. - Stavros N. Busenberg; Weifu Fang; Kazufumi Ito (SIAM J. Appl. Math., 1993)

Reconstruction of Semiconductor Doping Profile from Laser-Beam-Induced Current Image. - Weifu Fang; Kazufumi Ito (SIAM J. Appl. Math., 1994)

Weak solutions for diffusion-convection equations. - Weifu Fang; Kazufumi Ito (Appl. Math. Lett., 2000)

Parameter Identification for Semiconductor Diodes by LBIC Imaging. - David A. Redfern; Kazufumi Ito; Weifu Fang (SIAM J. Appl. Math., 2002)

An Implementation of Fast Wavelet Galerkin Methods for Integral Equations of the Second Kind. - Weifu Fang; Yi Wang; Yuesheng Xu (J. Sci. Comput., 2004)

LBIC imaging of semiconductor arrays: the cross-sectional model. - Weifu Fang; Kazufumi Ito; David A. Redfern (Math. Comput. Model., 2004)

Reconstruction of permittivity profile from boundary capacitance data. - Weifu Fang (Appl. Math. Comput., 2006)

Recovery of an interface from boundary measurement in an elliptic differential equation. - Weifu Fang; Suxing Zeng (Adv. Comput. Math., 2012)

Simultaneous recovery of Robin boundary and coefficient for the Laplace equation by shape derivative. - Weifu Fang (J. Comput. Appl. Math., 2022)