Very small snapback silicon-controlled rectifier for electrostatic discharge protection in 28 nm processing. - Weihuai Wang; Hao Jin; Wei Guo; Shurong Dong; Wei Liang 004; Juin J. Liou; Yan Han (Microelectron. Reliab., 2016)

Comparative study of reliability degradation behaviors of LDMOS and LDMOS-SCR ESD protection devices. - Zhihui Yu; Hao Jin; Shurong Dong; Hei Wong; Jie Zeng; Weihuai Wang (Microelectron. Reliab., 2016)