Testing FPGA devices on an Automatic Test Equipment. - Weikun Xie; Huibin Zhang; Qiuli Zhang (ICIA, 2013)

Blade-type phase-change random access memory technology, challenge and prospect. - Weikun Xie; Lei Wang; Long Chen; Houjun Wang (IEICE Electron. Express, 2023)

RDPP-TD: Reputation and Data Privacy-Preserving based Truth Discovery Scheme in Mobile Crowdsensing. - Lijian Wu; Weikun Xie; Wei Tan; Tian Wang 001; Houbing Herbert Song; Anfeng Liu (CoRR, 2025)

Test Primitives: The Unified Notation for Characterizing March Test Sequences. - Ruiqi Zhu; Houjun Wang; Susong Yang; Weikun Xie; Yindong Xiao (IEEE Trans. Very Large Scale Integr. Syst., 2025)