Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash® memory cell. - Zigui Cao; Bo Zhang; Xiong Zhang; Elton Lee; Weiran Kong (Microelectron. Reliab., 2008)

A 0.5-V novel complementary current-reused CMOS LNA for 2.4 GHz medical application. - Ruofan Dai; Yunlong Zheng; Jun He; Guojun Liu; Weiran Kong; Shichang Zou (Microelectron. J., 2016)

Design Techniques for a 30-ns Access Time 1.5-V 200-KB Embedded EEPROM Memory. - Yiran Xu; Jian Hu; Jun Xiao; Guangjun Yang; Weiran Kong (IEEE Trans. Circuits Syst. II Express Briefs, 2016)

Area-efficient charge pump with local boost technique for embedded flash memory. - Yiran Xu; Wenyi Zhu; Jun Xiao; Guangjun Yang; Jian Hu; Xiaoyun Li; Weiran Kong; Shichang Zou (IEICE Electron. Express, 2017)

A duplex current-reused CMOS LNA with complementary derivative superposition technique. - Ruofan Dai; Yunlong Zheng; Jun He; Weiran Kong; Shichang Zou (Int. J. Circuit Theory Appl., 2017)

Investigation of read disturb in split-gate memory and its feasible solution. - Wenyi Zhu; Binghan Li; Tao Yu; Weiran Kong; Shichang Zou (Microelectron. Reliab., 2017)

Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device. - Zhaozhao Xu; Donghua Liu; Wei Xiong; Jun Hu; Wenting Duan; Hualun Chen; Wensheng Qian; Weiran Kong; Shichang Zou (Microelectron. Reliab., 2018)

A 280-KBytes Twin-Bit-Cell Embedded NOR Flash Memory With a Novel Sensing Current Protection Enhanced Technique and High-Voltage Generating Systems. - Yiran Xu; Wenyi Zhu; Jun Xiao; Guangjun Yang; Jian Hu; Shengbo Zhang; Mingyong Huang; Weiran Kong; Shichang Zou (IEEE Trans. Circuits Syst. II Express Briefs, 2018)

Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS. - Zhaozhao Xu; Donghua Liu; Jun Hu; Feng Jin; Xinjie Yang; Wenting Duan; Wei Yue; Ziquan Fang; Wensheng Qian; Weiran Kong; Shichang Zou (Microelectron. J., 2019)