Wen Chen

According to our database, Wen Chen authored at least 17 papers between 2012 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Hybrid Methodology for Verification of SW Safety Mechanisms.

Sarvesh Patankar, Sainath Karlapalem, Sakshi Biyani, Wen Chen, Roman Chovanec, Martin Vlk, Martin Kaspar

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2019

Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs.

Wen Chen, Jayanta Bhadra

IEEE Des. Test, 2019

2018

Protecting the supply chain for automotives and IoTs.

Sandip Ray, Wen Chen, Rosario Cammarota

Proceedings of the 55th Annual Design Automation Conference, 2018

2017

Challenges and Trends in Modern SoC Design Verification.

Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang

IEEE Des. Test, 2017

Data-Driven Test Plan Augmentation for Platform Verification.

Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra

IEEE Des. Test, 2017

Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification.

Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang

IEEE Des. Test, 2017

Extensibility in Automotive Security: Current Practice and Challenges: Invited.

Sandip Ray, Wen Chen, Jayanta Bhadra, Mohammad Abdullah Al Faruque

Proceedings of the 54th Annual Design Automation Conference, 2017

Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery.

Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra

Proceedings of the 54th Annual Design Automation Conference, 2017

Feature extraction from design documents to enable rule learning for improving assertion coverage.

Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

Striking a balance between SoC security and debug requirements.

Wen Chen, Jayanta Bhadra

Proceedings of the 29th IEEE International System-on-Chip Conference, 2016

2014

Data Learning Methodologies for Improving the Efficiency of Constrained Random Verification.

Wen Chen

PhD thesis, 2014

On application of data mining in functional debug.

Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, Jayanta Bhadra

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

2013

Novel test analysis to improve structural coverage - A commercial experiment.

Wen Chen, Li-C. Wang, Jayanta Bhadra, Magdy S. Abadir

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013

Simulation knowledge extraction and reuse in constrained random processor verification.

Wen Chen, Li-C. Wang, Jay Bhadra, Magdy S. Abadir

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012

Data mining based prediction paradigm and its applications in design automation.

Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang

Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012

Functional test content optimization for peak-power validation - An experimental study.

Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang

Proceedings of the 2012 IEEE International Test Conference, 2012

Novel test detection to improve simulation efficiency - A commercial experiment.

Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012