Stress-Induced Bending of Micromachined Bilayer Cantilever and Its Optical Application. - Ju-Nan Kuo; Gwo-Bin Lee; Wen-Fung Pan (ROBIO, 2004)

Geometric design for ultra-long needle probe card for digital light processing wafer testing. - Hao-Yuan Chang; Wen-Fung Pan; Meng-Kai Shih; Yi-Shao Lai (Microelectron. Reliab., 2010)