The impacts of high tensile stress CESL and geometry design on device performance and reliability for 90 nm SOI nMOSFETs. - Chieh-Ming Lai; Yean-Kuen Fang; Chien-Ting Lin; Chia-Wei Hsu; Wen-Kuan Yeh (Microelectron. Reliab., 2007)

Significantly improving sub-90 nm CMOSFET performances with notch-gate enhanced high tensile-stress contact etch stop layer. - Chia-Wei Hsu; Yean-Kuen Fang; Wen-Kuan Yeh; Chien-Ting Lin (Microelectron. Reliab., 2008)

Improvement of TDDB reliability, characteristics of HfO2 high-k/metal gate MOSFET device with oxygen post deposition annealing. - Chia-Wei Hsu; Yean-Kuen Fang; Wen-Kuan Yeh; Chun-Yu Chen; Yen-Ting Chiang; Feng-Renn Juang; Chien-Ting Lin; Chieh-Ming Lai (Microelectron. Reliab., 2010)

Impact of strain on hot electron reliability of dual-band power amplifier and integrated LNA-mixer RF performances. - Jiann-Shiun Yuan; J. Ma; Wen-Kuan Yeh; Chia-Wei Hsu (Microelectron. Reliab., 2010)

NBTI reliability on high-k metal-gate SiGe transistor and circuit performances. - Jiann-Shiun Yuan; Wen-Kuan Yeh; Shuyu Chen; Chia-Wei Hsu (Microelectron. Reliab., 2011)

The impact of interface/border defect on performance and reliability of high-k/metal-gate CMOSFET. - Wen-Kuan Yeh; Po-Ying Chen; Kwang-Jow Gan; Jer-Chyi Wang; Chao-Sung Lai (Microelectron. Reliab., 2013)

Using Capacitance Sensor to Extract Characteristic Signals of Dozing from Skin Surface. - Po-Ying Chen; Chi-Chang Chen; Wen-Kuan Yeh; Yukan Chang; Der-Chen Huang; Shyr-Shen Yu; Chwei-Shyong Tsai; Yu-Jung Huang; Wei-Cheng Lin; Shao-I Chu; Chung-Long Pan; Tsung-Hung Lin; et al. (J. Sensors, 2014)

Reliability of the doping concentration in an ultra-thin body and buried oxide silicon on insulator (SOI) and comparison with a partially depleted SOI. - Wen-Teng Chang; Chun-Ming Lai; Wen-Kuan Yeh (Microelectron. Reliab., 2014)

Influence of fin number on hot-carrier injection stress induced degradation in bulk FinFETs. - Wenqi Zhang; Tzuo-Li Wang; Yan-hua Huang; Tsu-Ting Cheng; Shih-Yao Chen; Yiying Li; Chun-Hsiang Hsu; Chih-Jui Lai; Wen-Kuan Yeh; Yilin Yang (Microelectron. Reliab., 2016)

Relationship of Channel and Surface Orientation to Mechanical and Electrical Stresses on N-Type FinFETs. - Wen-Teng Chang; Shih-Wei Lin; Min-Cheng Chen; Wen-Kuan Yeh (IEICE Trans. Electron., 2019)

Substrate Bias Effect on Dynamic Characteristics of a Monolithically Integrated GaN Half-Bridge. - Wen Yang; Jiann-Shiun Yuan; Balakrishnan Krishnan; An-Jye Tzou; Wen-Kuan Yeh (IRPS, 2020)