Transforming arc routing into node routing problems. - Wen Lea Pearn; Arjang A. Assad; Bruce L. Golden (Comput. Oper. Res., 1987)

New lower bounds for the Capacitated Arc Routing Problem. - Wen Lea Pearn (Networks, 1988)

Approximate solutions for the capacitated arc routing problem. - Wen Lea Pearn (Comput. Oper. Res., 1989)

Augment-insert algorithms for the capacitated arc routing problem. - Wen Lea Pearn (Comput. Oper. Res., 1991)

Algorithms for the Windy Postman Problem. - Wen Lea Pearn; Mao Lin Li (Comput. Oper. Res., 1994)

Solvable cases of the k-person Chinese postman problem. - Wen Lea Pearn (Oper. Res. Lett., 1994)

Algorithms for the Chinese postman problem on mixed networks. - Wen Lea Pearn; C. M. Liu (Comput. Oper. Res., 1995)

Algorithms for the rural postman problem. - Wen Lea Pearn; T. C. Wu (Comput. Oper. Res., 1995)

Improved solutions for the traveling purchaser problem. - Wen Lea Pearn; R. C. Chien (Comput. Oper. Res., 1998)

Improved solutions for the Chinese postman problem on mixed networks. - Wen Lea Pearn; J. B. Chou (Comput. Oper. Res., 1999)

The wafer probing scheduling problem (WPSP). - Wen Lea Pearn; Shu-Hsing Chung; Ming-Hsien Yang (J. Oper. Res. Soc., 2002)

Testing process performance based on the yield: an application to the liquid-crystal display module. - Jann-Pygn Chen; Wen Lea Pearn (Microelectron. Reliab., 2002)

Testing process capability for one-sided specification limit with application to the voltage level translator. - P. C. Lin; Wen Lea Pearn (Microelectron. Reliab., 2002)

A multiprocess performance analysis chart based on the incapability index Cpp: an application to the chip resistors. - Wen Lea Pearn; C. H. Ko; K. H. Wang (Microelectron. Reliab., 2002)

Cost benefit analysis of series systems with warm standby components. - Kuo-Hsiung Wang; Wen Lea Pearn (Math. Methods Oper. Res., 2003)

A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples. - Wen Lea Pearn; G. H. Lin (Microelectron. Reliab., 2003)

An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators. - Wen Lea Pearn; Ming-Hung Shu (Microelectron. Reliab., 2003)

Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC. - Wen Lea Pearn; Ming-Hung Shu (Microelectron. Reliab., 2003)

Erratum to "An algorithm for calculating the lower confidence bounds of CPU and CPL with application to low-drop-out linear regulators" [Microelectronics Reliability 2003;43: 495-502]. - Wen Lea Pearn; Ming-Hung Shu (Microelectron. Reliab., 2003)

Sensitivity analysis of the optimal management policy for a queuing system with a removable and non-reliable server. - Wen Lea Pearn; Jau-Chuan Ke; Ying Chung Chang (Comput. Ind. Eng., 2004)

Testing process performance based on capability index Cpk with critical values. - Wen Lea Pearn; P. C. Lin (Comput. Ind. Eng., 2004)

Optimal management of the N-policy M/Ek/1 queuing system with a removable service station: a sensitivity investigation. - Wen Lea Pearn; Ying Chung Chang (Comput. Oper. Res., 2004)

Algorithms for the wafer probing scheduling problem with sequence-dependent set-up time and due date restrictions. - Wen Lea Pearn; Shu-Hsing Chung; Ming-Hsien Yang; Y. H. Chen (J. Oper. Res. Soc., 2004)

Maximum entropy analysis to the N policy M/G/1 queueing system with server breakdowns and general startup times. - Kuo-Hsiung Wang; Tsung-Yin Wang; Wen Lea Pearn (Appl. Math. Comput., 2005)

A Bayesian approach for assessing process precision based on multiple samples. - Wen Lea Pearn; Chien-Wei Wu (Eur. J. Oper. Res., 2005)

Approximate solutions for the maximum benefit chinese postman problem. - Wen Lea Pearn; W. C. Chiu (Int. J. Syst. Sci., 2005)

Cost benefit analysis of series systems with warm standby components and general repair time. - Kuo-Hsiung Wang; Yi-Chun Liu; Wen Lea Pearn (Math. Methods Oper. Res., 2005)

Measuring process capability based on CPK with gauge measurement errors. - Wen Lea Pearn; Mou-Yuan Liao (Microelectron. Reliab., 2005)

Production quality and yield assurance for processes with multiple independent characteristics. - Wen Lea Pearn; Chien-Wei Wu (Eur. J. Oper. Res., 2006)

Multiple-process performance analysis chart based on process loss indices. - Wen Lea Pearn; Y. C. Chang; Chien-Wei Wu (Int. J. Syst. Sci., 2006)

Variables sampling plans with PPM fraction of defectives and process loss consideration. - Wen Lea Pearn; Chien-Wei Wu (J. Oper. Res. Soc., 2006)

One-sided Process Capability Assessment in the Presence of Measurement Errors. - Wen Lea Pearn; Mou-Yuan Liao (Qual. Reliab. Eng. Int., 2006)

Encyclopedia and Handbook of Process Capability Indices - A Comprehensive Exposition of Quality Control Measures - Wen Lea Pearn; Samuel Kotz (WorldScientific, 2006)

On the Sampling Distributions of the Estimated Process Loss Indices with Asymmetric Tolerances. - Y. C. Chang; Wen Lea Pearn; Chien-Wei Wu (Commun. Stat. Simul. Comput., 2007)

Accuracy Analysis of the Percentile Method for Estimating Non Normal Manufacturing Quality. - Chien-Wei Wu; Wen Lea Pearn; C. S. Chang; H. C. Chen (Commun. Stat. Simul. Comput., 2007)

Optimal tool replacement for processes with low fraction defective. - Wen Lea Pearn; Ya-Chen Hsu (Eur. J. Oper. Res., 2007)

Tool replacement policy for one-sided processes with low fraction defective. - Wen Lea Pearn; Ya-Chen Hsu; Jyh-Jen Horng Shiau (J. Oper. Res. Soc., 2007)

Testing process precision for truncated normal distributions. - Wen Lea Pearn; H. N. Hung; N. F. Peng; C. Y. Huang (Microelectron. Reliab., 2007)

Measuring process capability based on Cpmk with gauge measurement errors. - Bi-Min Hsu; Ming-Hung Shu; Wen Lea Pearn (Qual. Reliab. Eng. Int., 2007)

Capability adjustment for gamma processes with mean shift consideration in implementing Six Sigma program. - Ya-Chen Hsu; Wen Lea Pearn; Pei-Ching Wu (Eur. J. Oper. Res., 2008)

A variables sampling plan based on C. - Chien-Wei Wu; Wen Lea Pearn (Eur. J. Oper. Res., 2008)

Solution strategies for multi-stage wafer probing scheduling problem with reentry. - Wen Lea Pearn; Shu-Hsing Chung; Ming-Hsien Yang; K. P. Shiao (J. Oper. Res. Soc., 2008)

An Improved Approach for Estimating Product Performance Based on the Capability Index Cpmk. - Wen Lea Pearn; Dong-Yuh Yang; Ya Ching Cheng (Commun. Stat. Simul. Comput., 2009)

Sample size determination for production yield estimation with multiple independent process characteristics. - Ya-Chen Hsu; Wen Lea Pearn; Ya-Fei Chuang (Eur. J. Oper. Res., 2009)

Supplier selection for one-sided processes with unequal sample sizes. - Wen Lea Pearn; H. N. Hung; Ya Ching Cheng (Eur. J. Oper. Res., 2009)

Fast and effective algorithms for the liquid crystal display module (LCM) scheduling problem with sequence-dependent setup time. - Shu-Hsing Chung; Wen Lea Pearn; Y. T. Tai (J. Oper. Res. Soc., 2009)

Comparison of two randomized policy M/G/1 queues with second optional service, server breakdown and startup. - Kuo-Hsiung Wang; Dong-Yuh Yang; Wen Lea Pearn (J. Comput. Appl. Math., 2010)

Process selection for higher production yield based on capability index Spk. - Chen-ju Lin; Wen Lea Pearn (Qual. Reliab. Eng. Int., 2010)

The performance measures and randomized optimization for an unreliable server M[x]/G/1 vacation system. - Jau-Chuan Ke; Kai-Bin Huang; Wen Lea Pearn (Appl. Math. Comput., 2011)

Optimal production run time for two-stage production system with imperfect processes and allowable shortages. - Wen Lea Pearn; Rung-Hung Su; Ming-Wei Weng; Chang-Hsien Hsu (Central Eur. J. Oper. Res., 2011)

Decision-making in a single-period inventory environment with fuzzy demand. - Rung-Hung Su; Dong-Yuh Yang; Wen Lea Pearn (Expert Syst. Appl., 2011)

Comparative analysis of a randomized N-policy queue: An improved maximum entropy method. - Kuo-Hsiung Wang; Dong-Yuh Yang; Wen Lea Pearn (Expert Syst. Appl., 2011)

Optimal management for infinite capacity N-policy M/G/1 queue with a removable service station. - Y. C. Chang; Wen Lea Pearn (Int. J. Syst. Sci., 2011)

Multi-server retrial queue with second optional service: algorithmic computation and optimisation. - Jau-Chuan Ke; Chia-Huang Wu; Wen Lea Pearn (Int. J. Syst. Sci., 2011)

Capability assessment for processes with multiple characteristics: A generalization of the popular index Cpk. - Wen Lea Pearn; J.-J. H. Shiau; Yu-Ting Tai; M. Y. Li (Qual. Reliab. Eng. Int., 2011)

Production yield measure for multiple characteristics processes based on ({S_{pk}^T} ) under multiple samples. - Wen Lea Pearn; Ching-Ho Yen; Dong-Yuh Yang (Central Eur. J. Oper. Res., 2012)

A batch arrival queue under randomised multi-vacation policy with unreliable server and repair. - Jau-Chuan Ke; Kai-Bin Huang; Wen Lea Pearn (Int. J. Syst. Sci., 2012)

Analysis of an infinite multi-server queue with an optional service. - Jau-Chuan Ke; Chia-Huang Wu; Wen Lea Pearn (Comput. Ind. Eng., 2013)

Measuring PPM Non-conformities for Processes with Asymmetric Tolerances. - Wen Lea Pearn; Chia-Huang Wu (Qual. Reliab. Eng. Int., 2013)

A Close Form Solution for the Product Acceptance Determination Based on the Popular Index Cpk. - Wen Lea Pearn; Chia-Huang Wu (Qual. Reliab. Eng. Int., 2013)

Supplier Selection Critical Decision Values for Processes with Multiple Independent Lines. - Wen Lea Pearn; Chia-Huang Wu (Qual. Reliab. Eng. Int., 2013)

An Extension of the Product Acceptance Determination for One-Sided Process with Multiple Characteristics. - Wen Lea Pearn; Chia-Huang Wu; H. N. Hung; C. M. Kao (Qual. Reliab. Eng. Int., 2013)

A Note on "Capability Assessment for Processes with Multiple Characteristics: A Generalization of the Popular Index Cpk". - Wen Lea Pearn; Chia-Huang Wu; M. C. Tsai (Qual. Reliab. Eng. Int., 2013)

Yield-Related Process Capability Indices for Processes of Multiple Quality Characteristics. - Jyh-Jen Horng Shiau; Chia-Ling Yen; Wen Lea Pearn; Wan-Tsz Lee (Qual. Reliab. Eng. Int., 2013)

Product Acceptance Determination for Processes with Multiple Independent Lines. - Wen Lea Pearn; Chia-Huang Wu; C. C. Chuang (Qual. Reliab. Eng. Int., 2014)

Product mix determination and capacity allocation for heterogeneous products in thin film transistor liquid crystal display manufacturing. - Y. T. Tai; Wen Lea Pearn; C. C. Chen (Comput. Ind. Eng., 2015)

An enhanced model for the integrated production and transportation problem in a multiple vehicles environment. - He-Yau Kang; Wen Lea Pearn; I-Ping Chung; Amy H. I. Lee (Soft Comput., 2016)

Lower confidence bounds as precision measure for truncated processes. - Chia-Huang Wu; Wen Lea Pearn; Yu Ting Tai; Pi Chuan Lin (Commun. Stat. Simul. Comput., 2017)

Dynamic operating policy for the controllable queue with two removable unreliable servers. - Jau-Chuan Ke; Chia-Huang Wu; Wen Lea Pearn (Int. J. Comput. Math. Comput. Syst. Theory, 2017)

Power analysis for group supplier selection with multiple production lines. - Wen Lea Pearn; Y. T. Tai; Yu-Wen Wu; Yuan-An Wang (Qual. Reliab. Eng. Int., 2018)

A note on Group Selection with multiple quality characteristics: power comparison of two methods. - Wen Lea Pearn; Chen-ju Lin; Y. H. Chen; J. Y. Huang (Int. J. Prod. Res., 2019)

An improved measure of quality loss for notching processes. - Chia-Huang Wu; Ya-Chen Hsu; Wen Lea Pearn (Qual. Reliab. Eng. Int., 2021)

Improved profit model for production of MicroLED PCB with asymmetric specifications. - Chia-Huang Wu; Wen Lea Pearn; Yu-Ting Tai (J. Oper. Res. Soc., 2023)