Deep Learning Algorithms for the Work Function Fluctuation of Random Nanosized Metal Grains on Gate-All-Around Silicon Nanowire MOSFETs. - Chandni Akbar; Yiming Li 005; Wen-Li Sung (IEEE Access, 2021)

A Nanosized-Metal-Grain Pattern-Dependent Threshold Voltage Model for the Work Function Fluctuation of GAA Si NW MOSFETs. - Wen-Li Sung; Yiming Li 005 (IEEE Access, 2021)

Transfer learning approach to analyzing the work function fluctuation of gate-all-around silicon nanofin field-effect transistors. - Chandni Akbar; Yiming Li 005; Wen-Li Sung (Comput. Electr. Eng., 2022)

A Hybrid 1D-CNN-LSTM Technique for WKF-Induced Variability of Multi-Channel GAA NS- and NF-FETs. - Sagarika Dash; Yiming Li 005; Wen-Li Sung (IEEE Access, 2023)