Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors. - Sheng-Yi Huang; Kun-Ming Chen; Guo-Wei Huang; Cheng-Chou Hung; Wen-Shiang Liao; Chun-Yen Chang 002 (Microelectron. Reliab., 2008)

Thermal stress probing the channel-length modulation effect of nano n-type FinFETs. - Fu-Yuan Tuan; Chii-Wen Chen; Mu-Chun Wang; Wen-Shiang Liao; Shea-Jue Wang; Shou-Kong Fan; Wen-How Lan (Microelectron. Reliab., 2018)