Test automation for kernel code and disk arrays with virtual devices. - Lin-Zan Cai; Rong-Shiung Wu; Wen-Ting Huang; Farn Wang (ASE, 2007)

Employing box plots to build high-dimensional manufacturing models for new products in TFT-LCD plants. - Der-Chiang Li; Wen-Ting Huang; Chien-Chih Chen; Che-Jung Chang (Neurocomputing, 2014)

The attribute-trend-similarity method to improve learning performance for small datasets. - Der-Chiang Li; Wu-Kuo Lin; Liang-Sian Lin; Chien-Chih Chen; Wen-Ting Huang (Int. J. Prod. Res., 2017)