Defect detection of monocrystalline silicon wafers for photovoltaic applications using an improved you only look once version 8 small algorithm. - Wenbo Bi; Xinyu Wang; Na Liu; Xu Xing; Lu Li; Hao Liu (Eng. Appl. Artif. Intell., 2026)

Lightweight certificateless authenticated key agreement protocol for IIoT. - Hongju Xia; Wenbo Bi; Jinsheng Zhang; Heng Zhang (Ann. des Télécommunications, 2026)