An Exploration for Influencing Factors of Interaction Learning in Web-based Instruction. - Xiufang Sun; Wenfa Zhan (CSCWD, 2006)

Block Marking and Updating Coding in Test Data Compression for SoC. - Lei Zhang 008; Huaguo Liang; Wenfa Zhan; Cuiyun Jiang (ATS, 2007)

A Novel Collaborative Scheme of Test Data Compression Based on Fixed-Plus-variable-Length Coding. - Wenfa Zhan; Huaguo Liang; Feng Shi; Zhengfeng Huang (CSCWD, 2007)

Test data compression scheme based on variable-to-fixed-plus-variable-length coding. - Wenfa Zhan; Huaguo Liang; Feng Shi; Zhengfeng Huang (J. Syst. Archit., 2007)

An efficient collaborative test data compression scheme based on OLEL coding. - Wenfa Zhan (CSCWD, 2008)

A new collaborative scheme of test vector compression based on equal-run-length coding (ERLC). - Wenfa Zhan; Aiman El-Maleh (CSCWD, 2009)

A Test Vector Compression/Decompression Scheme Based on Logic Operation between Adjacent Bits (LOBAB) Coding. - Huaguo Liang; Wenfa Zhan; Qiang Luo; Cuiyun Jiang (PRDC, 2009)

A scheme of test data compression based on coding of even bits marking and selective output inversion. - Wenfa Zhan; Huaguo Liang; Cuiyun Jiang; Zhengfeng Huang; Aiman H. El-Maleh (Comput. Electr. Eng., 2010)

A LFSR Reseeding Scheme Based on Division by 2 to the Power of Integer. - Wenfa Zhan; Jun Ma; Shanshan Du; Jun Liu (J. Digit. Content Technol. its Appl., 2010)

A Novel x -ploiting Strategy for Improving Performance of Test Data Compression. - Maoxiang Yi; Huaguo Liang; Lei Zhang 008; Wenfa Zhan (IEEE Trans. Very Large Scale Integr. Syst., 2010)

A new scheme of test data compression based on equal-run-length coding (ERLC). - Wenfa Zhan; Aiman El-Maleh (Integr., 2012)

Bayesian Analysis for Dynamic Generalized Linear Latent Model with Application to Tree Survival Rate. - Yusheng Cheng; Mei-wen Ding; Ye-mao Xia; Wenfa Zhan (J. Appl. Math., 2014)

Automatic determination about precision parameter value based on inclusion degree with variable precision rough set model. - Yusheng Cheng; Wenfa Zhan; Xindong Wu 001; Yuzhou Zhang (Inf. Sci., 2015)

Scalable Omnidirectional Video Coding for Real-Time Virtual Reality Applications. - Deyang Liu; Ping An; Ran Ma; Wenfa Zhan; Liefu Ai (IEEE Access, 2018)

Multi-label learning of non-equilibrium labels completion with mean shift. - Yusheng Cheng; Zhao Dawei; Wenfa Zhan; Yibin Wang 002 (Neurocomputing, 2018)

Test patterns reordering method based on Gamma distribution. - Wenfa Zhan; Zhiwei Shao (Integr., 2020)

Content-Based Light Field Image Compression Method With Gaussian Process Regression. - Deyang Liu; Ping An; Ran Ma; Wenfa Zhan; Xinpeng Huang; Ali Abdullah Yahya (IEEE Trans. Multim., 2020)

View synthesis-based light field image compression using a generative adversarial network. - Deyang Liu; Xinpeng Huang; Wenfa Zhan; Liefu Ai; Xin Zheng; Shulin Cheng (Inf. Sci., 2021)

Fault-avoidance C-element based low overhead and TNU-resilient latch. - Zhengfeng Huang; Zhouyu Gong; Dongxing Ma; Xiaolei Wang; Yingchun Lu; Wenfa Zhan; Huaguo Liang; Tianming Ni (Microelectron. J., 2023)

An equivalent processing method for integrated circuit electrical parameter data using BP neural networks. - Wenfa Zhan; Luping Zhang; Xuejun Feng; Pan Pan; Xueyuan Cai; Xiaoqing Wen (Microelectron. J., 2023)

Reordering method of test set based on vector eigenvalues using critical area estimation. - Wenfa Zhan; Luping Zhang (Integr., 2024)

A new die-level flexible design-for-test architecture for 3D stacked ICs. - Qingping Zhang; Wenfa Zhan; Xiaoqing Wen (Integr., 2024)

Examining the role of tap cell in suppressing single event transient effect in 28-nm CMOS technology. - Chenyu Zhang; Yan Li 084; Wenfa Zhan; Wenping Geng; Ting Liang; Xiaoyang Zeng (Microelectron. J., 2024)

A SLvT Adaptive Test Method for Integrated Circuit Test Parameter Sets without Yield Loss. - Qiong Wu; Kaiming Hao; Wenfa Zhan (J. Electron. Test., 2024)