Reliability analysis for accelerated degradation data based on the Wiener process with random effects. - Xiaofei Wang; Bing Xing Wang; Wenhui Wu 002; Yili Hong 001 (Qual. Reliab. Eng. Int., 2020)

The prediction intervals of remaining useful life based on constant stress accelerated life test data. - Shuidan Qin; Bing Xing Wang; Wenhui Wu 002; Chao Ma (Eur. J. Oper. Res., 2022)