Low-leakage robust SRAM cell design for sub-100nm technologies. - Shengqi Yang; Wayne H. Wolf; Wenping Wang 004; Narayanan Vijaykrishnan; Yuan Xie 001 (ASP-DAC, 2005)

Accurate Stacking Effect Macro-Modeling of Leakage Power in Sub-100nm Circuits. - Shengqi Yang; Wayne H. Wolf; Narayanan Vijaykrishnan; Yuan Xie 001; Wenping Wang 004 (VLSI Design, 2005)

Predictive Modeling of the NBTI Effect for Reliable Design. - Sarvesh Bhardwaj; Wenping Wang 004; Rakesh Vattikonda; Yu Cao 001; Sarma B. K. Vrudhula (CICC, 2006)

Modeling and minimization of PMOS NBTI effect for robust nanometer design. - Rakesh Vattikonda; Wenping Wang 004; Yu Cao 001 (DAC, 2006)

An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology. - Wenping Wang 004; Vijay Reddy; Anand T. Krishnan; Rakesh Vattikonda; Srikanth Krishnan; Yu Cao 001 (CICC, 2007)

The Impact of NBTI on the Performance of Combinational and Sequential Circuits. - Wenping Wang 004; Shengqi Yang; Sarvesh Bhardwaj; Rakesh Vattikonda; Sarma B. K. Vrudhula; Frank Liu 001; Yu Cao 001 (DAC, 2007)

An efficient method to identify critical gates under circuit aging. - Wenping Wang 004; Zile Wei; Shengqi Yang; Yu Cao 001 (ICCAD, 2007)

Statistical prediction of circuit aging under process variations. - Wenping Wang 004; Vijay Reddy; Bo Yang; Varsha Balakrishnan; Srikanth Krishnan; Yu Cao 001 (CICC, 2008)

Node Criticality Computation for Circuit Timing Analysis and Optimization under NBTI Effect. - Wenping Wang 004; Shengqi Yang; Yu Cao 001 (ISQED, 2008)

Optimized Circuit Failure Prediction for Aging: Practicality and Promise. - Mridul Agarwal; Varsha Balakrishnan; Anshuman Bhuyan; Kyunglok Kim; Bipul C. Paul; Wenping Wang 004; Bo Yang; Yu Cao 001; Subhasish Mitra (ITC, 2008)

Scalable model for predicting the effect of negative bias temperature instability for reliable design. - Sarvesh Bhardwaj; Wenping Wang 004; Rakesh Vattikonda; Yu Cao 001; Sarma B. K. Vrudhula (IET Circuits Devices Syst., 2008)

Case Study of Reliability-Aware and Low-Power Design. - Shengqi Yang; Wenping Wang 004; Tiehan Lv; Wayne H. Wolf; Narayanan Vijaykrishnan; Yuan Xie 001 (IEEE Trans. Very Large Scale Integr. Syst., 2008)

A framework for estimating NBTI degradation of microarchitectural components. - Michael DeBole; Krishnan Ramakrishnan; Varsha Balakrishnan; Wenping Wang 004; Hong Luo; Yu Wang 002; Yuan Xie 001; Yu Cao 001; Narayanan Vijaykrishnan (ASP-DAC, 2009)

Gate replacement techniques for simultaneous leakage and aging optimization. - Yu Wang 002; Xiaoming Chen 003; Wenping Wang 004; Yu Cao 001; Yuan Xie 001; Huazhong Yang (DATE, 2009)

On the efficacy of input Vector Control to mitigate NBTI effects and leakage power. - Yu Wang 002; Xiaoming Chen 003; Wenping Wang 004; Varsha Balakrishnan; Yu Cao 001; Yuan Xie 001; Huazhong Yang (ISQED, 2009)

The Predictive Technology Model in the Late Silicon Era and Beyond. - Yu Cao 001; Asha Balijepalli; Saurabh Sinha; Chi-Chao Wang; Wenping Wang 004; Wei Zhao (Found. Trends Electron. Des. Autom., 2009)

New-Age: A Negative Bias Temperature Instability-Estimation Framework for Microarchitectural Components. - Michael DeBole; Krishnan Ramakrishnan; Varsha Balakrishnan; Wenping Wang 004; Hong Luo; Yu Wang 002; Yuan Xie 001; Yu Cao 001; Narayanan Vijaykrishnan (Int. J. Parallel Program., 2009)

The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis. - Wenping Wang 004; Shengqi Yang; Sarvesh Bhardwaj; Sarma B. K. Vrudhula; Frank Liu 001; Yu Cao 001 (IEEE Trans. Very Large Scale Integr. Syst., 2010)

Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques. - Yu Wang 002; Xiaoming Chen 003; Wenping Wang 004; Yu Cao 001; Yuan Xie 001; Huazhong Yang (IEEE Trans. Very Large Scale Integr. Syst., 2011)

NBTI-aware circuit node criticality computation. - Shengqi Yang; Wenping Wang 004; Mark Hagan; Wei Zhang 012; Pallav Gupta; Yu Cao 001 (ACM J. Emerg. Technol. Comput. Syst., 2013)