Improving small-delay fault coverage for on-chip delay measurement. - Wenpo Zhang; Kazuteru Namba; Hideo Ito (DFT, 2012)

Improving Test Coverage by Measuring Path Delay Time Including Transmission Time of FF. - Wenpo Zhang; Kazuteru Namba; Hideo Ito (IEICE Trans. Inf. Syst., 2013)

Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement. - Wenpo Zhang; Kazuteru Namba; Hideo Ito (IEICE Trans. Inf. Syst., 2014)

Improving Small-Delay Fault Coverage of On-Chip Delay Measurement by Segmented Scan and Test Point Insertion. - Wenpo Zhang; Kazuteru Namba; Hideo Ito (IEICE Trans. Inf. Syst., 2014)