Coni: Detecting Database Connector Bugs via State-Aware Test Case Generation. - Wenqian Deng; Jie Liang 006; Zhiyong Wu 010; Jingzhou Fu; Mingzhe Wang; Yu Jiang 001 (ICSE, 2025)

DDLumos: Understanding and Detecting Atomic DDL Bugs in DBMSs. - Zhiyong Wu 010; Jie Liang 006; Jingzhou Fu; Wenqian Deng; Yu Jiang 001 (USENIX ATC, 2025)