Investigation and impact of LDD variations on the drain disturb in normally-on SONOS NOR flash device. - Zhaozhao Xu; Donghua Liu; Wei Xiong; Jun Hu; Wenting Duan; Hualun Chen; Wensheng Qian; Weiran Kong; Shichang Zou (Microelectron. Reliab., 2018)

Demonstration of improvement of specific on-resistance versus breakdown voltage tradeoff for low-voltage power LDMOS. - Zhaozhao Xu; Donghua Liu; Jun Hu; Feng Jin; Xinjie Yang; Wenting Duan; Wei Yue; Ziquan Fang; Wensheng Qian; Weiran Kong; Shichang Zou (Microelectron. J., 2019)