Conductive Particle Detection for Chip on Glass Using Convolutional Neural Network. - Xian Tao; Wenzhi Ma; Zhenfeng Lu; Zhanxin Hou (IEEE Trans. Instrum. Meas., 2021)

Industrial Weak Scratches Inspection Based on Multifeature Fusion Network. - Xian Tao; Dapeng Zhang; Wei Hou; Wenzhi Ma; De Xu (IEEE Trans. Instrum. Meas., 2021)

Unsupervised Anomaly Detection for Surface Defects With Dual-Siamese Network. - Xian Tao; Dapeng Zhang; Wenzhi Ma; Zhanxin Hou; Zhenfeng Lu; Chandranath Adak (IEEE Trans. Ind. Informatics, 2022)

Human-like Observation-inspired Universal Image Acquisition System for Complex Surfaces in Industrial Product Inspection. - Tianbo Yang; Shaohu Wang; Yuchuang Tong; Menghan Zou; Xiuqin Shang; Wenzhi Ma; Zhengtao Zhang (Mach. Intell. Res., 2025)