Reliability aspects of semiconductor devices in high temperature applications. - Werner Kanert; H. Dettmer; Boris Plikat; Norbert Seliger (Microelectron. Reliab., 2003)

Semiconductors in high temperature applications - a future trend in automotive industry. - Michael Goroll; Reinhard Pufall; Werner Kanert; Boris Plikat (Microelectron. Reliab., 2004)

ESD protection structure qualification - a new approach for release for automotive applications. - Michael Goroll; Werner Kanert; Reinhard Pufall (Microelectron. Reliab., 2006)

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors. - Stefano Aresu; Werner Kanert; Reinhard Pufall; Michael Goroll (Microelectron. Reliab., 2007)

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices. - Michael Goroll; Werner Kanert; Reinhard Pufall; Stefano Aresu (Microelectron. Reliab., 2007)

Reduction of test effort. Looking for more acceleration for reliable components for automotive applications. - Reinhard Pufall; Werner Kanert; Stefano Aresu; Michael Goroll (Microelectron. Reliab., 2008)

Quality assurance in automotive electronics. - Verena Müller; Horst Lewitschnig; Nicoleta Kortik; Werner Kanert (Elektrotech. Informationstechnik, 2011)

Active cycling reliability of power devices: Expectations and limitations. - Werner Kanert (Microelectron. Reliab., 2012)

Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests. - Reinhard Pufall; Michael Goroll; Joachim Mahler; Werner Kanert; M. Bouazza; Olaf Wittler; Rainer Dudek (Microelectron. Reliab., 2012)

Robustness Validation - A physics of failure based approach to qualification. - Werner Kanert (Microelectron. Reliab., 2014)