An Approach to Chip-Internal Current Monitoring and Measurement Using an Electron Beam Tester. - Klaus Helmreich; Peter Nagel; Werner Wolz; Klaus D. Müller-Glaser (ITC, 1991)

Aspects on integration of high-speed multiplexers and demultiplexers in VLSI test systems. - Michael Chowanetz; Claus Kuntzsch; Werner Wolz (VTS, 1991)

Test/Agent: CAD-integrated Automatic Generation of Test Programs. - R. Arnold; Michael Chowanetz; Werner Wolz; Klaus D. Müller-Glaser (ITC, 1992)

DRC-based Selection of Optimal Probing Points for Chip-Internal Measurements. - R. Scharf; Claus Kuntzsch; Klaus Helmreich; Werner Wolz; Klaus D. Müller-Glaser (ITC, 1992)

Development of test programs in a virtual test environment. - M. Miegler; Werner Wolz (VTS, 1996)