Hardware Test Pattern Generation for Built-In Testing. - Wilfried Daehn; Joachim Mucha (ITC, 1981)

A Hardware Approach to Self-Testing of Large Programmable Logic Arrays. - Wilfried Daehn; Joachim Mucha (IEEE Trans. Computers, 1981)

Ein 32-Bit-Rechenwerk mit eingebautem Hardware-Selbsttest. - G. Grassl; Wilfried Daehn; U. Ludemann; Ulrich Theus (Fehlertolerierende Rechensysteme, 1982)

A unified treatment of PLA faults by Boolean differences. - Wilfried Daehn (DAC, 1986)

A Test Generator IC for Testing Large CMOS-RAMs. - Wilfried Daehn; Josef Gross (ITC, 1986)

Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. - Tom W. Williams; Wilfried Daehn; Matthias Gruetzner; Corot W. Starke (ITC, 1986)

Self-Test in a Standard Cell Environment. - Joachim Mucha; Wilfried Daehn; Josef Gross (IEEE Des. Test, 1986)

Aliasing Errors in Signature Analysis Registers. - Tom W. Williams; Wilfried Daehn; Matthias Gruetzner; Corot W. Starke (IEEE Des. Test, 1987)

Bounds and analysis of aliasing errors in linear feedback shift registers. - Tom W. Williams; Wilfried Daehn; Matthias Gruetzner; Corot W. Starke (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Accelerated test pattern generation by cone-oriented circuit partitioning. - Torsten Grüning; Udo Mahlstedt; Wilfried Daehn; Cengiz Özcan (EURO-DAC, 1990)

Contest: A Fast ATPG Tool for Very Large Combinatorial Circuits. - Udo Mahlstedt; Torsten Grüning; Cengiz Özcan; Wilfried Daehn (ICCAD, 1990)

Fault simulation using small fault samples. - Wilfried Daehn (J. Electron. Test., 1991)

Load Balancing in a Hybrid ATPG Environment. - Wilfried Daehn (IEEE Trans. Computers, 1991)

Iterative algorithms for computing aliasing probabilities. - André Ivanov; Corot W. Starke; Vinod K. Agarwal; Wilfried Daehn; Matthias Gruetzner; Tom W. Williams (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)

Distributed simulation for structural VHDL netlists. - David B. Bernstein; Werner van Almsick; Wilfried Daehn (EURO-DAC, 1994)

Electrosmog and Electromagnetic CAD (Invited Paper). - Wilfried Daehn (HPCN, 1994)

Fault modeling of differential ECL. - Udo Jorczyk; Wilfried Daehn; Oliver Neumann (EURO-DAC, 1995)

Electrosmog & electromagnetic CAD. - Wilfried Daehn (Future Gener. Comput. Syst., 1995)

A Central Control Engine for an Open and Hybrid Simulation Environment. - Werner van Almsick; Thorsten Drabe; Wilfried Daehn; Christian Müller-Schloer (DIS-RT, 1998)

An Open Simulation and Modeling Environment for Embedded Real-Time Systems. - Werner van Almsick; Thorsten Drabe; Wilfried Daehn; Christian Müller-Schloer (International Workshop on Rapid System Prototyping, 1998)

Demodulation based testing of off-chip driver performance. - Wilfried Daehn (ETW, 2001)