DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. - Will Howell; Friedrich Hapke; Edward Brazil; Srikanth Venkataraman; R. Datta; Andreas Glowatz; Wilfried Redemund; J. Schmerberg; Anja Fast; Janusz Rajski (ITC, 2018)

Defect-Oriented Test: Effectiveness in High Volume Manufacturing. - Friedrich Hapke; Will Howell; Peter C. Maxwell; Edward Brazil; Srikanth Venkataraman; Rudrajit Dutta; Andreas Glowatz; Anja Fast; Janusz Rajski (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)