Diagnosis with Limited Failure Information. - Yu Huang 005; Wu-Tung Cheng; Nagesh Tamarapalli; Janusz Rajski; Randy Klingenberg; Will Hsu; Yuan-Shih Chen (ITC, 2006)

Diagnose compound scan chain and system logic defects. - Yu Huang 005; Wu-Tung Cheng; Ruifeng Guo; Will Hsu; Yuan-Shih Chen; Albert Mann (ITC, 2007)

Faster defect localization in nanometer technology based on defective cell diagnosis. - Manish Sharma; Wu-Tung Cheng; Ting-Pu Tai; Y. S. Cheng; Will Hsu; Chen Liu; Sudhakar M. Reddy; Albert Mann (ITC, 2007)