A comprehensive production test solution for 1.5Gb/s and 3Gb/s serial-ATA - based on AWG and undersampling techniques. - Yi Cai; Amit Bhattacharyya; Joe Martone; Anant Verma; William Burchanowski (ITC, 2005)

An Accelerated Jitter Tolerance Test Technique on Ate for 1.5GB/S and 3GB/S Serial-ATA. - Yongquan Fan; Yi Cai; Liming Fang; Anant Verma; William Burchanowski; Zeljko Zilic; Sandeep Kumar (ITC, 2006)