Combining Data in Small Multiple-Method Studies. - Charles Hagwood; William F. Guthrie (Technometrics, 2006)

Effect of static analysis tools on software security: preliminary investigation. - Vadim Okun; William F. Guthrie; Romain Gaucher; Paul E. Black (QoP, 2007)

Comparison of SEM and HRTEM CD Measurements Extracted From Test Structures Having Feature Linewidths From 40 to 240 nm. - Michael W. Cresswell; Richard A. Allen; William F. Guthrie; Christine E. Murabito; Ronald G. Dixson; Amy Hunt (IEEE Trans. Instrum. Meas., 2008)