Practical optical waveform probing of flip-chip CMOS devices. - Keneth R. Wilsher; William K. Lo (ITC, 1999)

Optical interferometric probing of advanced microprocessors. - Travis M. Eiles; Keneth R. Wilsher; William K. Lo; G. Xiao (ITC, 2000)

Benefits of Phase Interference Detection to IC Waveform Probing. - Jeffrey A. Block; William K. Lo; Chris Shaw (Asian Test Symposium, 2001)

An ultra-low dark-count and jitter, superconducting, single-photon detector for emission timing analysis of integrated circuits. - P. LeCoupanec; William K. Lo; Keneth R. Wilsher (Microelectron. Reliab., 2003)

Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology. - Ulrike Kindereit; Christian Boit; Uwe Kerst; Steven Kasapi; Radu Ispasoiu; Roy Ng; William K. Lo (Microelectron. Reliab., 2008)

Jitter analysis of PLL-generated clock propagation using Jitter Mitigation techniques with laser voltage probing. - Joy Y. Liao; Tung Ton; Nathan Slattengren; Steven Kasapi; William K. Lo; Howard L. Marks; Yin S. Ng; Ted R. Lundquist (Microelectron. Reliab., 2009)