System Reliability Theory: Models and Statistics Methods (Arnljot Høyland and Marvin Rausand). - William Q. Meeker (SIAM Rev., 1996)

Statistical Prediction Based on Censored Life Data. - Luis A. Escobar; William Q. Meeker (Technometrics, 1999)

Estimating Fatigue Curves With the Random Fatigue-Limit Model. - Francis G. Pascual; William Q. Meeker (Technometrics, 1999)

Comparisons of Approximate Confidence Interval Procedures for Type I Censored Data. - Shuen-Lin Jeng; William Q. Meeker (Technometrics, 2000)

Parametric Simultaneous Confidence Bands for Cumulative Distributions From Censored Data. - Shuen-Lin Jeng; William Q. Meeker (Technometrics, 2001)

Weibull Prediction Intervals for a Future Number of Failures. - Daniel J. Nordman; William Q. Meeker (Technometrics, 2002)

Early Detection of Reliability Problems Using Information From Warranty Databases. - Huaiqing Wu; William Q. Meeker (Technometrics, 2002)

Recurrent Events Data Analysis for Product Repairs, Disease Recurrences, and Other Applications. - William Q. Meeker (Technometrics, 2003)

Block Bootstrap Estimation of the Distribution of Cumulative Outdoor Degradation. - Victor Chan; Soumendra Nath Lahiri; William Q. Meeker (Technometrics, 2004)

Discussion. - William Q. Meeker; Luis A. Escobar (Technometrics, 2004)

Sample Size and Number of Failure Requirements for Demonstration Tests With Log-Location-Scale Distributions and Failure Censoring. - Scott W. McKane; Luis A. Escobar; William Q. Meeker (Technometrics, 2005)

Auto-steered Information-Decision Processes for Electric System Asset Management. - James D. McCalley; Vasant G. Honavar; Sarah M. Ryan; William Q. Meeker; Ronald A. Roberts; Daji Qiao; Yuan Li (International Conference on Computational Science (3), 2006)

Bayesian Methods for Planning Accelerated Life Tests. - Yao Zhang; William Q. Meeker (Technometrics, 2006)

Integrated Decision Algorithms for Auto-steered Electric Transmission System Asset Management. - James D. McCalley; Vasant G. Honavar; Sarah M. Ryan; William Q. Meeker; Daji Qiao; Ronald A. Roberts; Yuan Li; Jyotishman Pathak; Mujing Ye; Yili Hong 001 (International Conference on Computational Science (1), 2007)

Avoiding Problems With Normal Approximation Confidence Intervals for Probabilities. - Yili Hong 001; William Q. Meeker; Luis A. Escobar (Technometrics, 2008)

The Future of Industrial Statistics: A Panel Discussion. - David M. Steinberg; Søren Bisgaard; Necip Doganaksoy; Nicholas Fisher; Bert Gunter; Gerald J. Hahn; Sallie Keller-McNulty; Jon R. Kettenring; William Q. Meeker; Douglas C. Montgomery; C. F. Jeff Wu (Technometrics, 2008)

Analysis of Window-Observation Recurrence Data. - Jianying Zuo; William Q. Meeker; Huaiqing Wu (Technometrics, 2008)

The Relationship Between Confidence Intervals for Failure Probabilities and Life Time Quantiles. - Yili Hong 001; William Q. Meeker; Luis A. Escobar (IEEE Trans. Reliab., 2008)

Using Accelerated Life Tests Results to Predict Product Field Reliability. - William Q. Meeker; Luis A. Escobar; Yili Hong 001 (Technometrics, 2009)

Accelerated Destructive Degradation Test Planning. - Ying Shi; Luis A. Escobar; William Q. Meeker (Technometrics, 2009)

Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information. - Yili Hong 001; William Q. Meeker (Technometrics, 2010)

A Tool for Evaluating Time-Varying-Stress Accelerated Life Test Plans With Log-Location-Scale Distributions. - Yili Hong 001; Haiming Ma; William Q. Meeker (IEEE Trans. Reliab., 2010)

Strategy for Planning Accelerated Life Tests With Small Sample Sizes. - Haiming Ma; William Q. Meeker (IEEE Trans. Reliab., 2010)

Accelerated Destructive Degradation Tests Robust to Distribution Misspecification. - Shuen-Lin Jeng; Bei-Ying Huang; William Q. Meeker (IEEE Trans. Reliab., 2011)

Bayesian Methods for Accelerated Destructive Degradation Test Planning. - Ying Shi; William Q. Meeker (IEEE Trans. Reliab., 2012)

Field-Failure Predictions Based on Failure-Time Data With Dynamic Covariate Information. - Yili Hong 001; William Q. Meeker (Technometrics, 2013)

Methods for Planning Repeated Measures Degradation Studies. - Brian P. Weaver; William Q. Meeker; Luis A. Escobar; Joanne Wendelberger (Technometrics, 2013)

Detecting cracks in aircraft engine fan blades using vibrothermography nondestructive evaluation. - Chunwang Gao; William Q. Meeker; Donna Mayton (Reliab. Eng. Syst. Saf., 2014)

Physical Model-Assisted Probability of Detection of Flaws in Titanium Forgings Using Ultrasonic Nondestructive Evaluation. - Ming Li; William Q. Meeker; R. Bruce Thompson (Technometrics, 2014)

The Residual Lifetime of Surviving Components From Failed Coherent Systems. - Zhengcheng Zhang; William Q. Meeker (IEEE Trans. Reliab., 2014)

Statistical Methods for Degradation Data With Dynamic Covariates Information and an Application to Outdoor Weathering Data. - Yili Hong 001; Yuanyuan Duan; William Q. Meeker; Deborah L. Stanley; Xiaohong Gu (Technometrics, 2015)

Statistical Methods for Estimating the Minimum Thickness Along a Pipeline. - ShiYao Liu; William Q. Meeker (Technometrics, 2015)

Assessing Risk of a Serious Failure Mode Based on Limited Field Data. - Zhibing Xu; Yili Hong 001; William Q. Meeker (IEEE Trans. Reliab., 2015)

Product Component Genealogy Modeling and Field-failure Prediction. - Caleb B. King; Yili Hong 001; William Q. Meeker (Qual. Reliab. Eng. Int., 2017)

A Statistical Framework for Improved Automatic Flaw Detection in Nondestructive Evaluation Images. - Ye Tian; Ranjan Maitra; William Q. Meeker; Stephen D. Holland (Technometrics, 2017)

A Multi-Level Trend-Renewal Process for Modeling Systems With Recurrence Data. - Zhibing Xu; Yili Hong 001; William Q. Meeker; Brock E. Osborn; Kati Illouz (Technometrics, 2017)

Estimating a Parametric Component Lifetime Distribution from a Collection of Superimposed Renewal Processes. - Wei Zhang; Ye Tian; Luis A. Escobar; William Q. Meeker (Technometrics, 2017)

Stochastic-Expansions-Based Model-Assisted Probability of Detection Analysis of the Spherically-Void-Defect Benchmark Problem. - Xiaosong Du; Praveen Gurrala; Leifur Leifsson; Jiming Song; William Q. Meeker; Ronald A. Roberts; Slawomir Koziel; Yonatan A. Tesfahunegn (ICCS (2), 2018)

A Hierarchical Model for Heterogenous Reliability Field Data. - Eric Mittman; Colin Lewis-Beck; William Q. Meeker (Technometrics, 2019)

Reliability Analysis of Artificial Intelligence Systems Using Recurrent Events Data from Autonomous Vehicles. - Yili Hong 001; Jie Min; Caleb B. King; William Q. Meeker (CoRR, 2021)

Quantitative Matching of Forensic Evidence Fragments Utilizing 3D Microscopy Analysis of Fracture Surface Replicas. - Bishoy Dawood; Carlos Llosa-Vite; Geoffrey Z. Thompson; Barbara K. Lograsso; Lauren K. Claytor; John Vanderkolk; William Q. Meeker; Ranjan Maitra; Ashraf Bastawros (CoRR, 2021)

Bayesian Methods for Planning Accelerated Repeated Measures Degradation Tests. - Brian P. Weaver; William Q. Meeker (Technometrics, 2021)

Prediction of Future Failures for Heterogeneous Reliability Field Data. - Colin Lewis-Beck; Qinglong Tian; William Q. Meeker (Technometrics, 2022)

Optimal Planning of Destructive Degradation Tests. - Jiaxiang Cai; William Q. Meeker; Zhi-Sheng Ye 001 (Technometrics, 2025)

A Spatially Correlated Competing Risks Time-to-Event Model for Supercomputer GPU Failure Data. - Jie Min; Yili Hong 001; William Q. Meeker; George Ostrouchov (Technometrics, 2025)