Reliability of power electronic devices against cosmic radiation-induced failure. - Gerald Sölkner; Winfried Kaindl; Hans-Joachim Schulze; Gerhard K. M. Wachutka (Microelectron. Reliab., 2004)

Analysis of the role of the parasitic BJT of Super-Junction power MOSFET under TLP stress. - Tudor Chirila; Winfried Kaindl; Tobias Reimann; Michael Rüb; Uwe Wahl (Microelectron. Reliab., 2015)