Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress. - Sergey Bychikhin; Viktor Dubec; Dionyz Pogany; Erich Gornik; M. Graf; V. Dudek; Winfried Soppa (Microelectron. Reliab., 2004)

Experimental and numerical analysis of current flow homogeneity in low voltage SOI multi-finger gg-NMOS and NPN ESD protection devices. - Michael Heer; Sergey Bychikhin; W. Mamanee; Dionyz Pogany; A. Heid; P. Grombach; M. Klaussner; Winfried Soppa; Bernd Ramler (Microelectron. Reliab., 2007)