Precise failure localization using automated layout analysis of diagnosis candidates. - Wing Chiu Tam; Osei Poku; R. D. (Shawn) Blanton (DAC, 2008)

Automated failure population creation for validating integrated circuit diagnosis methods. - Wing Chiu Tam; Osei Poku; R. D. (Shawn) Blanton (DAC, 2009)

Controlling DPPM through Volume Diagnosis. - Xiaochun Yu; Yen-Tzu Lin; Wing Chiu Tam; Osei Poku; Ronald D. Blanton (VTS, 2009)

Automatic classification of bridge defects. - Jeffrey E. Nelson; Wing Chiu Tam; Ronald D. Blanton (ITC, 2010)

Systematic defect identification through layout snippet clustering. - Wing Chiu Tam; Osei Poku; Ronald D. Blanton (ITC, 2010)

Evaluating yield and testing impact of sub-wavelength lithography. - Wing Chiu Tam; R. D. (Shawn) Blanton; Wojciech Maly (VTS, 2010)

To DFM or not to DFM? - Wing Chiu Tam; R. D. (Shawn) Blanton (DAC, 2011)

SLIDER: A fast and accurate defect simulation framework. - Wing Chiu Tam; Ronald D. Blanton (VTS, 2011)

Yield Learning Through Physically Aware Diagnosis of IC-Failure Populations. - R. D. (Shawn) Blanton; Wing Chiu Tam; Xiaochun Yu; Jeffrey E. Nelson; Osei Poku (IEEE Des. Test Comput., 2012)

Physically-Aware Analysis of Systematic Defects in Integrated Circuits. - Wing Chiu Tam; Ronald D. Blanton (IEEE Des. Test Comput., 2012)

SLIDER: Simulation of Layout-Injected Defects for Electrical Responses. - Wing Chiu Tam; R. D. (Shawn) Blanton (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012)

Design-for-Manufacturability Assessment for Integrated Circuits Using RADAR. - Wing Chiu Tam; R. D. (Shawn) Blanton (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014)

LASIC: Layout Analysis for Systematic IC-Defect Identification Using Clustering. - Wing Chiu Jason Tam; Ronald Shawn Blanton (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015)