Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS. - Mohamed H. Abu-Rahma; Ying Chen; Wing Sy; Wee Ling Ong; Leon Yeow Ting; Sei Seung Yoon; Michael Han 002; Esin Terzioglu (CICC, 2011)

Silicon Process Impact on 5G NR mmWave Front End Design and Performance. - Chuan-Cheng Cheng; Jeremy Dunworth; Sriram Kalpat; Haitao Cheng; Gang Liu; Ming-Ta Yang; Wing Sy; Joseph Wang 002; Kamal Sahota; P. R. Chidi Chidambaram (VLSI-DAT, 2019)