Self-testing of fully differential multistage circuits using common-mode excitation. - Wojciech Toczek (Microelectron. Reliab., 2008)

Diagnosis of fully differential circuits based on a fault dictionary implemented in the microcontroller systems. - Wojciech Toczek; Zbigniew Czaja (Microelectron. Reliab., 2011)

Risk Analysis by a Probabilistic Model of the Measurement Process. - Wojciech Toczek; Janusz M. Smulko (Sensors, 2021)