A merged MuGFET and planar SOI process. - Andrew Marshall; C. Rinn Cleavelin; Weize Xiong; Christian Pacha; Gerhard Knoblinger; Klaus Von Armin; Thomas Schulz; Klaus Schruefer; Ken Matthews; Wolfgang Molzer; Paul Patruno; Christian Russ (SoCC, 2007)

On the device design assessment of multigate FETs (MuGFETs) using full process and device simulation with 3D TCAD. - Muhammad Nawaz; Wolfgang Molzer; Stefan Decker; Luis-Felipe Giles; Thomas Schulz (Microelectron. J., 2007)

Thermal issues in test: An overview of the significant aspects and industrial practice. - Juergen Alt; Paolo Bernardi; Alberto Bosio; Riccardo Cantoro; Hans G. Kerkhoff; Andreas Leininger; Wolfgang Molzer; Alessandro Motta; Christian Pacha; Alberto Pagani; Alireza Rohani; R. Strasser (VTS, 2016)